LDMOS Technology for RF Power Amplifiers

被引:59
|
作者
Theeuwen, S. J. C. H. [1 ]
Qureshi, J. H. [1 ]
机构
[1] NXP Semicond, NL-6534 AE Nijmegen, Netherlands
关键词
Microwave amplifiers; MOSFET power amplifiers (PAs); power amplifiers; semiconductor device fabrication;
D O I
10.1109/TMTT.2012.2193141
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We show the status of laterally diffused metal-oxide-semiconductor (LDMOS) technology, which has been the device of choice for RF power applications for more than one decade. LDMOS fulfills the requirements for a wide range of class AB and pulsed applications, such as base station, broadcast, and microwave. We present state-of-the-art RF performance of the LDMOS transistor measured with a load-pull test setup, achieving class-AB drain efficiencies of 70% at 2 GHz for on-wafer and packaged devices. Furthermore, the results for several class-AB and Doherty amplifier implementations constructed with this technology are shown. As an illustration, a three-way Doherty application is demonstrated, which has a 7.5-dB back-off efficiency of 47% at 1.8 GHz with a peak power of 700 W and linearity numbers better than -65 dBc.
引用
收藏
页码:1755 / 1763
页数:9
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