Undervoltage Detector Circuit for Avionics using single supply voltage with MOS-FET

被引:0
|
作者
Won, Joo Ho [1 ]
Ko, HyungHo [2 ]
机构
[1] Korea Aerosp Res Inst, Satellite Elect Team, Taejon, South Korea
[2] Chungnam Natl Univ, Dept Elect, Taejon, South Korea
关键词
UVD; MOS-FET; threshold voltage;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Under-voltage detector (UVD) is consisted of the comparator and voltage divider, which is used for the reference and comparison with that reference in avionics. It is best for this UVD to use only one supply, but general UVD in commercial and avionics application has to use different supply for reference with comparator supply. This paper propose the advance UVD circuit, which use the threshold characteristics of MOS-FET, and makes it possible for UVD circuit to use only one supply for target and reference.
引用
收藏
页数:2
相关论文
共 50 条
  • [31] Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage
    Forero, Freddy
    Gomez, Andres
    Champac, Victor
    JOURNAL OF LOW POWER ELECTRONICS, 2016, 12 (04) : 395 - 402
  • [33] High Voltage LED Supply Using a Hysteretic Controlled Single Stage Boost Converter
    Leon-Masich, Antonio
    Valderrama, Hugo
    Maria Bosque, Josep
    Martinez, Luis
    Flores, Freddy
    PRZEGLAD ELEKTROTECHNICZNY, 2012, 88 (1A): : 26 - 30
  • [34] Low Swing TSV Signaling using Novel Level Shifters with Single Supply Voltage
    Fang, Shiwei
    Salman, Emre
    2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2015, : 1965 - 1968
  • [35] Readout Electronics Using Single-Flux-Quantum Circuit Technology for Superconducting Single-Photon Detector Array
    Terai, Hirotaka
    Miki, Shigetoshi
    Wang, Zhen
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2009, 19 (03) : 350 - 353
  • [36] A Robust Single Supply Voltage SRAM Read Assist Technique Using Selective Precharge
    Abu-Rahma, Mohamed H.
    Anis, Mohab
    Yoon, Sei Seung
    ESSCIRC 2008: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE, 2008, : 234 - +
  • [37] A Testing Approach for MOS Circuit Using Single-Photon Detectors Under High Magnetic Fields
    Zhongliang Pan
    Ling Chen
    Junfang Chen
    Guangzhao Zhang
    Peiheng Wu
    Journal of Low Temperature Physics, 2013, 170 : 403 - 408
  • [38] A Testing Approach for MOS Circuit Using Single-Photon Detectors Under High Magnetic Fields
    Pan, Zhongliang
    Chen, Ling
    Chen, Junfang
    Zhang, Guangzhao
    Wu, Peiheng
    JOURNAL OF LOW TEMPERATURE PHYSICS, 2013, 170 (5-6) : 403 - 408
  • [39] Low Voltage and Low Power Current-Mode Divider and 1/X Circuit Using MOS Transistor in Subthreshold
    Munir A. Al-Absi
    Arabian Journal for Science and Engineering, 2013, 38 : 2411 - 2414
  • [40] Low Voltage and Low Power Current-Mode Divider and 1/X Circuit Using MOS Transistor in Subthreshold
    Al-Absi, Munir A.
    ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING, 2013, 38 (09) : 2411 - 2414