Chemical analysis of graphene oxide films after heat and chemical treatments by X-ray photoelectron and Micro-Raman spectroscopy

被引：2935

作者：

Yang, Dongxing ^{[2
]}

Velamakanni, Aruna ^{[2
]}

Bozoklu, Guelay ^{[3
]}

Park, Sungjin ^{[2
]}

Stoller, Meryl ^{[2
]}

Piner, Richard D. ^{[2
]}

Stankovich, Sasha ^{[4
]}

Jung, Inhwa ^{[2
]}

Field, Daniel A. ^{[1
]}

Ventrice, Carl A., Jr. ^{[1
]}

Ruoff, Rodney S. ^{[2
]}

机构：

[1] SW Texas State Univ, Dept Phys, San Marcos, TX 78666 USA

[2] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA

[3] Sabanci Univ, Fac Engn & Nat Sci, TR-34956 Istanbul, Turkey

[4] Northwestern Univ, Dept Mech Engn, Evanston, IL 60208 USA

来源：

CARBON | 2009年 / 47卷 / 01期

基金：

美国国家科学基金会;

关键词：

THIN-FILMS; GRAPHITE; XPS; TRANSPARENT; REDUCTION;

D O I：

10.1016/j.carbon.2008.09.045

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Several nanometer-thick graphene oxide films deposited on silicon nitride-on silicon substrates were exposed to nine different heat treatments (three in Argon, three in Argon and Hydrogen, and three in ultra-high vacuum), and also a film was held at 70 degrees C while being exposed to a vapor from hydrazine monohydrate. The films were characterized with atomic force microscopy to obtain local thickness and variation in thickness over extended regions. X-ray photoelectron spectroscopy was used to measure significant reduction of the oxygen content of the films; heating in ultra-high vacuum was particularly effective. The overtone region of the Raman spectrum was used, for the first time, to provide a "fingerprint" of changing oxygen content. (C) 2008 Elsevier Ltd. All rights reserved.

引用

页码：145 / 152

页数：8

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