A very promising method for thin (of nanoscale thickness) A(II)B(VI) layer fabrication is the pulsed laser deposition (PLD) method. The initial stage of the CdTe layer growth on Si(001) and CdTe(001) substrates was simulated using the Monte Carlo (MC) procedure. A model for the layer growth included: surface diffusion, absorption and desorption of adatoms, kinetic energy of atoms or ions in the plasma plume and the time distance between consecutive pulses. The shape of the clusters formed clearly depends on these conditions. Layers were obtained for various substrate temperatures. We analysed the morphology and the cross-sections of the layers obtained. The quality of the layers obtained was studied by a fractal description. The results of the simulations allow to determine the correct choice of the layer growth parameters in the real process. (C) 2003 Elsevier B.V. All rights reserved.
机构:
Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South KoreaKorea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
Kim, Kwang-Chon
Baek, Seung Hyub
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Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
Baek, Seung Hyub
Choi, Won Chel
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Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
Choi, Won Chel
Kim, Hyun Jae
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Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South KoreaKorea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
Kim, Hyun Jae
Song, Jin Dong
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Korea Inst Sci & Technol, Nano Photon Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
Song, Jin Dong
Kim, Jin-Sang
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Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
机构:
Institute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, NovosibirskInstitute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, Novosibirsk
Zverev A.V.
Neizvestny I.G.
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Institute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, NovosibirskInstitute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, Novosibirsk
Neizvestny I.G.
Chemakin A.V.
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Institute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, NovosibirskInstitute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, Novosibirsk
Chemakin A.V.
Shwartz N.L.
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Institute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, NovosibirskInstitute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, Novosibirsk
Shwartz N.L.
Yanovitskaya Z.Sh.
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Institute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, NovosibirskInstitute of Semiconductor Physics, Siberian Division, Russian Academy of Sciences, Novosibirsk