Electron diffraction measurement of the binding rigidity of free-standing graphene

被引：3
|
作者：
Kirilenko, D. A. [1 ,2 ]
机构：
[1] Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] Univ Antwerp, EMAT, BE-2020 Antwerp, Belgium
来源：
TECHNICAL PHYSICS LETTERS | 2013年 / 39卷 / 04期
关键词：
Tilt Angle; Integral Intensity; Electron Diffraction Pattern; Technical Physic Letter; Reciprocal Space;
D O I：
10.1134/S1063785013040081
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample.
引用
收藏
页码：325 / 328
页数：4
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