The influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting

被引：8
|
作者：
Mo, L
Cassette, P
Baldock, C
机构：
[1] CEA Saclay, CEA, BNM, Lab Natl Henri Becquerel, F-91191 Gif Sur Yvette, France
[2] Univ Sydney, Sch Phys, Inst Med Phys, Sydney, NSW 2006, Australia
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2006年 / 558卷 / 02期
关键词：
TDCR; CIEMAT/NIST; single photoelectron peak; fraction correction; H-3; Ni-63; C-14 and Sr-90/Y-90;
D O I：
10.1016/j.nima.2005.11.210
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Zero discrimination level setting of liquid scintillation systems for counting of all single photoelectron pulses is required by both triple-to-double coincidence ratio (TDCR) and CIEMAT/NIST methods. However, this requirement may not be able to be met in some circumstances. The influence of rejection of a fraction of the single photoelectron peak has been studied both theoretically and experimentally on H-3, Ni-63, C-14 and Sr-90/Y-90 for both the TDCR and CIEMAT/NIST methods. A modified formula for calculation of efficiency is given in consideration of the rejected fraction of the single photoelectron peak. Crown Copyright (c) 2005 Published by Elsevier B.V. All rights reserved.
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页码：490 / 496
页数：7
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