Carrier transport and recombination in p-doped and intrinsic 1.3 μm InAs/GaAs quantum-dot lasers -: art. no. 211114

被引:83
|
作者
Marko, IP [1 ]
Massé, NF
Sweeney, SJ
Andreev, AD
Adams, AR
Hatori, N
Sugawara, M
机构
[1] Univ Surrey, Adv Technol Inst, Sch Elect & Phys Sci, Guildford GU2 7XH, Surrey, England
[2] Fujitsu Labs Ltd, Opt Semicond Devices Lab, Atsugi, Kanagawa 2430197, Japan
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.2135204
中图分类号
O59 [应用物理学];
学科分类号
摘要
The radiative and nonradiative components of the threshold current in 1.3 mu m, p-doped and undoped quantum-dot semiconductor lasers were studied between 20 and 370 K. The complex behavior can be explained by simply assuming that the radiative recombination and nonradiative Auger recombination rates are strongly modified by thermal redistribution of carriers between the dots. The large differences between the devices arise due to the trapped holes in the p-doped devices. These both greatly increase Auger recombination involving hole excitation at low temperatures and decrease electron thermal escape due to their Coulombic attraction. The model explains the high T-0 values observed near room temperature. (c) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
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