Dynamical coupling and negative differential resistance from interactions across the molecule-electrode interface in molecular junctions

被引:9
|
作者
Dubi, Yonatan [1 ,2 ]
机构
[1] Ben Gurion Univ Negev, Dept Chem, IL-84105 Beer Sheva, Israel
[2] Ben Gurion Univ Negev, Ilze Katz Inst Nanoscale Sci & Technol, IL-84105 Beer Sheva, Israel
来源
JOURNAL OF CHEMICAL PHYSICS | 2013年 / 139卷 / 15期
关键词
CHARGE-TRANSPORT; TEMPERATURE; DEVICE; HEAT;
D O I
10.1063/1.4825157
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Negative differential resistance - a decrease in current with increasing bias voltage - is a counter-intuitive effect that is observed in various molecular junctions. Here, we present a novel mechanism that may be responsible for such an effect, based on strong Coulomb interaction between electrons in the molecule and electrons on the atoms closest to the molecule. The Coulomb interaction induces electron-hole binding across the molecule-electrode interface, resulting in a renormalized and enhanced molecule-electrode coupling. Using a self-consistent non-equilibrium Green's function approach, we show that the effective coupling is non-monotonic in bias voltage, leading to negative differential resistance. The model is in accord with recent experimental observations that showed a correlation between the negative differential resistance and the coupling strength. We provide detailed suggestions for experimental tests which may help to shed light on the origin of the negative differential resistance. Finally, we demonstrate that the interface Coulomb interaction affects not only the I-V curves but also the thermoelectric properties of molecular junctions. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:7
相关论文
共 50 条
  • [21] Electron transport in asymmetric biphenyl molecular junctions: effects of conformation and molecule-electrode distance
    Sweta Parashar
    Pankaj Srivastava
    Manisha Pattanaik
    Sandeep Kumar Jain
    The European Physical Journal B, 2014, 87
  • [22] Empirical Parameter to Compare Molecule-Electrode Interfaces in Large-Area Molecular Junctions
    Carlotti, Marco
    Soni, Saurabh
    Kovalchuk, Andrii
    Kumar, Sumit
    Hofmann, Stephan
    Chiechi, Ryan C.
    ACS PHYSICAL CHEMISTRY AU, 2022, 2 (03): : 179 - 190
  • [23] Understanding the Molecule-Electrode Interface for Molecular Spintronic Devices: A Computational and Experimental Study
    Rosado Piquer, Lidia
    Royo Sanchez, Raquel
    Carolina Sanudo, E.
    Echeverria, Jorge
    MOLECULES, 2018, 23 (06):
  • [24] Mixed Monolayers of Spiropyrans Maximize Tunneling Conductance Switching by Photoisomerization at the Molecule-Electrode Interface in EGaln Junctions
    Kumar, Sumit
    van Herpt, Jochem T.
    Gengler, Regis Y. N.
    Feringa, Ben L.
    Rudolf, Petra
    Chiechi, Ryan C.
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2016, 138 (38) : 12519 - 12526
  • [25] Enhancement of intramolecular electron scattering due to molecule-electrode coupling in molecular junction systems
    Kondo, Hisashi
    Nara, Jun
    Ohno, Takahisa
    PHYSICAL REVIEW B, 2010, 81 (08):
  • [26] Current-induced atomic motion, structural instabilities, and negative temperatures on molecule-electrode interfaces in electronic junctions
    Preston, Riley J.
    Kershaw, Vincent F.
    Kosov, Daniel S.
    PHYSICAL REVIEW B, 2020, 101 (15)
  • [27] Impedance spectroscopy as useful tool to study molecule-electrode interfaces and the dielectric response of molecular tunnel junctions
    Nijhuis, Christian
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2016, 251
  • [28] Effect of asymmetric molecule–electrode coupling and molecular bias on rectification in molecular junctions
    Rupan Preet Kaur
    Ravinder Singh Sawhney
    Derick Engles
    Applied Physics A, 2016, 122
  • [29] Negative differential resistance in molecular junctions: Application to graphene ribbon junctions
    Cheraghchi, Hosein
    Esfarjani, Keivan
    PHYSICAL REVIEW B, 2008, 78 (08)
  • [30] Observation of negative differential resistance in DNA molecular junctions
    Kang, Ning
    Erbe, Artur
    Scheer, Elke
    APPLIED PHYSICS LETTERS, 2010, 96 (02)