Terminal reliability using binary decision diagrams

被引：22
|
作者：
Singh, H [1 ]
Vaithilingam, S [1 ]
Anne, RK [1 ]
Anneberg, L [1 ]
机构：
[1] LAWRENCE TECHNOL UNIV,DEPT ELECT ENGN,SOUTHFIELD,MI 48075
来源：
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 03期
关键词：
D O I：
10.1016/0026-2714(95)00087-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Terminal reliability has been a topic of research for the last three decades. Several techniques for determining terminal reliability are available in literature. Binary decision diagrams have attracted the attention of several digital logic research workers. The objective of this paper is to illustrate how binary decision diagrams can be exploited for determining terminal reliability of networks.
引用
收藏
页码：363 / 365
页数：3
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