Chemical liquid deposition of gallium nitride thin films on siloxane-anchored self-assembled monolayers

被引:10
|
作者
Niesen, TP
Puchinger, M
Gerstel, P
Rodewald, D
Wolff, J
Wagner, T
Bill, J
Aldinger, F
机构
[1] Univ Stuttgart, Pulvermet Lab, Max Planck Inst Met Forsch, D-70569 Stuttgart, Germany
[2] Univ Stuttgart, Inst Nichtmet Anorgan Mat, D-70569 Stuttgart, Germany
[3] Max Planck Inst Met Res, D-70174 Stuttgart, Germany
关键词
gallium nitride (GaN); thin films; self-assembled monolayers; chemical liquid deposition; precursor pyrolysis;
D O I
10.1016/S0254-0584(01)00393-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chemical liquid deposition was used to form Ga- and N-containing thin films on single-crystal silicon and sapphire substrates. Films were grown from a gallium carbodiimide-based polymeric precursor solution at room temperature on the substrates which were previously functionalized by amine-terminated self-assembled monolayers followed by pyrolysis in NH3 at 900degreesC. On sapphire, epitaxial growth of hexagonal gallium nitride islands was found after pyrolysis. The composition, morphology and microstructure of the films were characterized by Auger electron spectroscopy, X-ray diffraction, and scanning and transmission electron microscopy. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:301 / 305
页数:5
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