Determination of Parameters of Thin Semiconductor Layers by means of One-dimensional Microwave Photonic Crystals

被引：0
|
作者：
Ponomarev, D. V. [1 ]
Nikitov, S. A. [1 ]
Usanov, D. A. [1 ]
Skripal, A. V. [1 ]
Postelga, A. E. [1 ]
机构：
[1] Saratov NG Chernyshevskii State Univ, Dept Solid State Phys, Lab Metamat, Astrahanskaya Str 83, Saratov 410012, Russia
来源：
2012 19th International Conference on Microwave Radar and Wireless Communications (MIKON), Vols 1 and 2 | 2012年
关键词：
Microwave photonic crystal; measurement; electrical conductivity; thickness; semiconductor layer;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The possibility to simultaneously determine the thickness and the electrical conductivity of thin semiconductor layer, which play a role of the irregularity in one-dimensional waveguide photonic crystals, using the results of measurement of reflection and transmission spectra in microwave band has been shown. The results of computer modeling and the inverse problem solving are presented.
引用
收藏
页码：789 / 793
页数：5
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