Determination of Parameters of Thin Semiconductor Layers by means of One-dimensional Microwave Photonic Crystals

被引:0
|
作者
Ponomarev, D. V. [1 ]
Nikitov, S. A. [1 ]
Usanov, D. A. [1 ]
Skripal, A. V. [1 ]
Postelga, A. E. [1 ]
机构
[1] Saratov NG Chernyshevskii State Univ, Dept Solid State Phys, Lab Metamat, Astrahanskaya Str 83, Saratov 410012, Russia
关键词
Microwave photonic crystal; measurement; electrical conductivity; thickness; semiconductor layer;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The possibility to simultaneously determine the thickness and the electrical conductivity of thin semiconductor layer, which play a role of the irregularity in one-dimensional waveguide photonic crystals, using the results of measurement of reflection and transmission spectra in microwave band has been shown. The results of computer modeling and the inverse problem solving are presented.
引用
收藏
页码:789 / 793
页数:5
相关论文
共 50 条
  • [1] Determination of Parameters of Thin Semiconductor Layers on the Basis of One-Dimensional Microwave Photon Crystals
    Gulyaev, Yu. V.
    Nikitov, S. A.
    Usanov, D. A.
    Skripal, A. V.
    Postel'ga, A. E.
    Ponomarev, D. V.
    DOKLADY PHYSICS, 2012, 57 (04) : 145 - 147
  • [2] Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals
    Yu. V. Gulyaev
    S. A. Nikitov
    D. A. Usanov
    A. V. Skripal’
    A. E. Postel’ga
    D. V. Ponomarev
    Doklady Physics, 2012, 57 : 145 - 147
  • [3] Application of one-dimensional microwave photonic crystals for measurements of parameters of structures based on thin semiconductor layers
    Usanov, Dmitry A.
    Nikitov, Sergey A.
    Skripal, Alexander V.
    Ponomarev, Denis V.
    2012 PROCEEDINGS OF THE INTERNATIONAL CONFERENCE DAYS ON DIFFRACTION (DD), 2012, : 229 - 233
  • [4] Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals
    S. A. Nikitov
    Yu. V. Gulyaev
    D. A. Usanov
    A. V. Skripal’
    D. V. Ponomarev
    Doklady Physics, 2013, 58 : 6 - 8
  • [5] Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals
    Nikitov, S. A.
    Gulyaev, Yu. V.
    Usanov, D. A.
    Skripal', A. V.
    Ponomarev, D. V.
    DOKLADY PHYSICS, 2013, 58 (01) : 6 - 8
  • [6] Multiparametric measurements of epitaxial semiconductor structures with the use of one-dimensional microwave photonic crystals
    D. A. Usanov
    S. A. Nikitov
    A. V. Skripal’
    D. V. Ponomarev
    E. V. Latysheva
    Journal of Communications Technology and Electronics, 2016, 61 : 42 - 49
  • [7] Multiparametric measurements of epitaxial semiconductor structures with the use of one-dimensional microwave photonic crystals
    Usanov, D. A.
    Nikitov, S. A.
    Skripal', A. V.
    Ponomarev, D. V.
    Latysheva, E. V.
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 2016, 61 (01) : 42 - 49
  • [8] Microwave Photonic Structures and Their Application for Measurements of Parameters of Thin Semiconductor Layers
    Usanov, D. A.
    Skripal, A. V.
    Ponomarev, D. V.
    Latysheva, E. V.
    Nikitov, S. A.
    2014 44TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2014, : 984 - 987
  • [9] Fano Resonance by Means of the One-Dimensional Superconductor Photonic Crystals
    Aly, Arafa H.
    Mohamed, Doaa
    Elsayed, Hussein A.
    Mehaney, Ahmed
    JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, 2018, 31 (12) : 3827 - 3833
  • [10] Fano Resonance by Means of the One-Dimensional Superconductor Photonic Crystals
    Arafa H. Aly
    Doaa Mohamed
    Hussein A. Elsayed
    Ahmed Mehaney
    Journal of Superconductivity and Novel Magnetism, 2018, 31 : 3827 - 3833