Resonant X-ray scattering studies of epitaxial complex oxide thin films

被引：6

作者：

Perret, Edith ^{[1
]}

Park, Changyong ^{[2
]}

Fong, Dillon D. ^{[1
]}

Chang, Kee-Chul ^{[1
]}

Ingram, Brian J. ^{[3
]}

Eastman, Jeffrey A. ^{[1
]}

Baldo, Peter M. ^{[1
]}

Fuoss, Paul H. ^{[1
]}

机构：

[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[2] Carnegie Inst Sci, HPCAT, Geophys Lab, Argonne, IL 60439 USA

[3] Argonne Natl Lab, Chem Sci & Engn Div, Argonne, IL 60439 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2013年 / 46卷

基金：

美国国家科学基金会;

关键词：

SURFACE-STRUCTURE DETERMINATION; FULVIC-ACID; ADSORPTION; INTERFACE; REFLECTIVITY; (001)-WATER; DISPERSION; EXPANSION; STRONTIUM; COPPER;

D O I：

10.1107/S0021889812047620

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Resonant anomalous X-ray reflectivity (RAXR) is a powerful technique for measuring element-specific distribution profiles across surfaces and buried interfaces. Here, the RAXR technique is applied to characterize a complex oxide heterostructure, La0.6Sr0.4Co0.2Fe0.8O3-delta, on NdGaO3, and the effects of data sampling and model-dependent fitting procedures on the extracted elemental distribution profile are evaluated. The strontium profile through a 3.5 nm-thick film at 973 K and at an oxygen partial pressure of 150 Torr (1 Torr = 133.32 Pa) was determined from the measured RAXR spectra. The results demonstrate that in situ RAXR measurements can provide key insights into temperature-and environment-dependent elemental segregation processes, relevant, for example, in assessing the cathode performance of solid oxide fuel cells.

引用

页码：76 / 87

页数：12

共 50 条

[21] Positron annihilation and X-ray diffraction studies on tin oxide thin films
Prabakar, K.
Abhaya, S.
Krishnan, R.
Kalavathi, S.
Dash, S.
Jayapandian, J.
Amarendra, G.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (07): : 1167 - 1170
[22] X-ray absorption spectroscopy studies of electrochemically deposited thin oxide films
Balasubramanian, M
Melendres, CA
Mansour, AN
Mini, S
APPLICATIONS OF SYNCHROTRON RADIATION TECHNIQUES TO MATERIALS SCIENCE IV, 1998, 524 : 339 - 345
[23] X-ray scattering from uniform and patterned indium tin oxide thin films
Clarke, J
Pape, I
Normile, P
Tanner, BK
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2003, 36 (10A) : A209 - A213
[24] Probing Organic Thin Films by Coherent X-ray Imaging and X-ray Scattering
Patil, Nilesh
Narayanan, Theyencheri
Michels, Leander
Skjonsfjell, Eirik Torbjorn Bakken
Guizar-Sicairos, Manuel
Van den Brande, Niko
Claessens, Raf
Van Mele, Bruno
Breiby, Dag Werner
ACS APPLIED POLYMER MATERIALS, 2019, 1 (07) : 1787 - 1797
[25] X-ray absorption and resonant photoemission studies of Mn doped SrTiO3 epitaxial films
Kubacki, Jerzy
Kajewski, Dariusz
Koehl, Annemarie
Wojtyniak, Marcin
Dittmann, Regina
Szade, Jacek
RADIATION PHYSICS AND CHEMISTRY, 2013, 93 : 123 - 128
[26] Resonant X-Ray Scattering Studies of Charge Order in Cuprates
Comin, Riccardo
Damascelli, Andrea
ANNUAL REVIEW OF CONDENSED MATTER PHYSICS, VOL 7, 2016, 7 : 369 - 405
[27] Resonant inelastic x-ray scattering studies of elementary excitations
Ament, Luuk J. P.
van Veenendaal, Michel
Devereaux, Thomas P.
Hill, John P.
van den Brink, Jeroen
REVIEWS OF MODERN PHYSICS, 2011, 83 (02) : 705 - 767
[28] X-ray scattering from epitaxial GaSb/InAs thin films below and above the critical thickness
Babkevich, AY
Cowley, RA
Mason, NJ
Sandiford, S
Stunault, A
JOURNAL OF PHYSICS-CONDENSED MATTER, 2002, 14 (30) : 7101 - 7121
[29] Asymptotic x-ray scattering from highly mismatched epitaxial films
Kaganer, VM
Shalimov, A
Bak-Misiuk, J
Ploog, KH
JOURNAL OF PHYSICS-CONDENSED MATTER, 2006, 18 (22) : 5047 - 5055
[30] X-ray anomalous scattering studies of Fe-Tb amorphous thin films
Kim, Chan Wook
Watanabe, Yasuhiro
Nanao, Susumu
ADVANCES IN NANOMATERIALS AND PROCESSING, PTS 1 AND 2, 2007, 124-126 : 1653 - +

← 1 2 3 4 5 →