Variable-Step 12-bit ADC based on Counter Ramp Recycling Architecture suitable for CMOS Imagers with Column-Parallel Readout

被引:0
|
作者
Hassan, Tarek M. [1 ]
Strobel, Markus [1 ]
Richter, Harald [1 ]
Burghartz, Joachim N. [1 ]
机构
[1] Inst Microelect Stuttgart IMS CHIPS, Stuttgart, Germany
关键词
algorithmic; counter ramp; multi-step; column-parallel; analog-to-digital converters; HIGH-SPEED; SENSOR;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 12-bit counter ramp recycling analog-to-digital converter (ADC) is proposed, which can be configured in a single-step mode for achieving high conversion accuracy as well as in various multi-step modes for yielding high conversion speed. A unique ADC circuit realization is used for the different modes of operation, while a digital control unit is responsible for providing the necessary control signals to the ADC. Similar to common counter ramp architectures, the proposed implementation is suitable for column-parallel readout owing to its simplicity. The proposed variable-step recycling ADC is implemented in a 0.18 mu m CMOS technology from UMC. Simulation results show good agreement with the expected trade-off between speed and accuracy, which is common to all conventional ADCs.
引用
收藏
页码:41 / 44
页数:4
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