Numerical studies on the electro-optic sampling of relativistic electron bunches

被引:0
|
作者
Casalbuoni, S [1 ]
Schlarb, H [1 ]
Schmidt, B [1 ]
Steffen, B [1 ]
Schmüser, P [1 ]
Winter, A [1 ]
机构
[1] DESY, D-2000 Hamburg, Germany
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ultraviolet and X ray free electron lasers require sub-picosecond electron bunches of high charge density. Electro-optic sampling (EOS) is a suitable diagnostic tool for resolving the time structure of these ultrashort bunches. The transient electric field of the relativistic bunch induces a polarization anisotropy in a nonlinear crystal which is sampled by femtosecond laser pulses. In this paper, the EOS process is studied in detailed numerical calculations. The THz and the laser pulses are treated as wave packets which are propagated through the zinc telluride resp. gallium phosphide crystals. The effects of signal broadening and distortion are taken into account. The time resolution is severely limited by transverse optical (TO) lattice oscillations (5.3 THz in ZnTe, 11 THz in GaP). The shortest bunch length which can be resolved with moderate distortion is about 200 fs (FWHM) in ZnTe and 100 fs in GaP.
引用
收藏
页码:1863 / 1865
页数:3
相关论文
共 50 条
  • [31] Simulation study for electro-optic sampling measurement of low-energy electron beam
    Parc, Yong Woon
    Ko, Juho Hong In Soo
    Kim, Changbum
    Huang, Jun Yun
    Lee, Soo Heyong
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (01) : 342 - 346
  • [32] Comparison of measurement results obtained by electron beam testing and indirect electro-optic sampling
    Batinic, M
    Weisbrodt, B
    Mertin, W
    Kubalek, E
    MICROELECTRONIC ENGINEERING, 1996, 31 (1-4) : 33 - 40
  • [33] Nonellipsometric electro-optic sampling of terahertz waves in GaAs
    Shugurov, A., I
    Mashkovich, E. A.
    Bodrov, S. B.
    Tani, M.
    Bakunov, M., I
    OPTICS EXPRESS, 2018, 26 (18): : 23359 - 23365
  • [34] Pulse waveform characterization by electro-optic sampling at NIM
    Feng, Zhigang
    Zhao, Kejia
    Li, Bo
    Yang, Zhijun
    Song, Zhenfei
    Cui, Xiaohai
    2020 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM), 2020,
  • [35] RF Waveform Noise Measurement by Electro-optic Sampling
    Sosnicki, Filip
    Golestani, Ali
    Karpinski, Michal
    2023 48TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, IRMMW-THZ, 2023,
  • [36] GaAs Photonic Crystal Switch for Electro-Optic Sampling
    Mollie, Gregory
    de Rossi, Alfredo
    Lehoucq, Gaelle
    Tripon-Canseliet, Charlotte
    Morgenroth, Laurence
    Neuilly, Francois
    Decoster, Didier
    Bellanca, Gaetano
    Combrie, Sylvain
    2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2016,
  • [37] Proton-bombarded GaP electro-optic sampling
    Zhang, DM
    Tian, XJ
    Wang, YS
    Li, DH
    Yi, MB
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 1999, 18 (01) : 26 - 30
  • [38] Analysis of Subcycle Electro-Optic Sampling Without Background
    Beckh, Cornelius
    Sulzer, Philipp
    Fritzsche, Niklas
    Riek, Claudius
    Leitenstorfer, Alfred
    JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES, 2021, 42 (06) : 701 - 714
  • [39] Simplified setup for electro-optic sampling of terahertz pulses
    Grebenev, V
    Bartels, L
    APPLIED OPTICS, 2003, 42 (09) : 1721 - 1725
  • [40] Analysis of Subcycle Electro-Optic Sampling Without Background
    Cornelius Beckh
    Philipp Sulzer
    Niklas Fritzsche
    Claudius Riek
    Alfred Leitenstorfer
    Journal of Infrared, Millimeter, and Terahertz Waves, 2021, 42 : 701 - 714