Numerical studies on the electro-optic sampling of relativistic electron bunches

被引:0
|
作者
Casalbuoni, S [1 ]
Schlarb, H [1 ]
Schmidt, B [1 ]
Steffen, B [1 ]
Schmüser, P [1 ]
Winter, A [1 ]
机构
[1] DESY, D-2000 Hamburg, Germany
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ultraviolet and X ray free electron lasers require sub-picosecond electron bunches of high charge density. Electro-optic sampling (EOS) is a suitable diagnostic tool for resolving the time structure of these ultrashort bunches. The transient electric field of the relativistic bunch induces a polarization anisotropy in a nonlinear crystal which is sampled by femtosecond laser pulses. In this paper, the EOS process is studied in detailed numerical calculations. The THz and the laser pulses are treated as wave packets which are propagated through the zinc telluride resp. gallium phosphide crystals. The effects of signal broadening and distortion are taken into account. The time resolution is severely limited by transverse optical (TO) lattice oscillations (5.3 THz in ZnTe, 11 THz in GaP). The shortest bunch length which can be resolved with moderate distortion is about 200 fs (FWHM) in ZnTe and 100 fs in GaP.
引用
收藏
页码:1863 / 1865
页数:3
相关论文
共 50 条
  • [1] Numerical studies on the electro-optic detection of femtosecond electron bunches
    Casalbuoni, S.
    Schlarb, H.
    Schmidt, B.
    Schmueser, P.
    Steffen, B.
    Winter, A.
    PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 2008, 11 (07):
  • [2] Study of the spatio-temporal profile diagnostics for relativistic picosecond electron bunches by electro-optic sampling
    Ota, M.
    Kan, K.
    Komada, S.
    Arikawa, Y.
    Mag-Usara, V. K.
    Agulto, V. C.
    Wang, Y. W.
    Sakawa, Y.
    Matsui, T.
    Nakajima, M.
    2021 46TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ), 2021,
  • [3] Electro-optic sampling of single electron beam bunches of ultrashort duration
    Bolton, PR
    Clendenin, JE
    Dowell, DH
    Krejcik, P
    Rifkin, J
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 507 (1-2): : 220 - 223
  • [4] Study of the measurement for electron bunches and the irradiation effect by femtosecond electro-optic sampling
    Nakajima, M.
    Ota, M.
    Kan, K.
    Arikawa, Y.
    Shimizu, T.
    Segawa, S.
    Sakawa, Y.
    2020 45TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2020,
  • [5] Electro-optic sampling for time resolving relativistic ultrafast electron diffraction
    Scoby, C. M.
    Musumeci, P.
    Moody, J.
    Gutierrez, M.
    Tran, T.
    ADVANCED ACCELERATOR CONCEPTS, 2009, 1086 : 655 - 660
  • [6] Electro-optic sampling beam position monitor for relativistic electron beams
    Hunt-Stone, Keenan
    Ariniello, Robert
    Doss, Christopher
    Lee, Valentina
    Litos, Mike
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 999
  • [7] Benchmarking of electro-optic monitors for femtosecond electron bunches
    Berden, G.
    Gillespie, W. A.
    Jamison, S. P.
    Knabbe, E.-A.
    MacLeod, A. M.
    van der Meer, A. F. G.
    Phillips, P. J.
    Schlarb, H.
    Schmidt, B.
    Schmueser, P.
    Steffen, B.
    PHYSICAL REVIEW LETTERS, 2007, 99 (16)
  • [8] Measurement of relativistic electron beam bunch length by electro-optic sampling method
    Sun, Da-Rui
    Xu, Jin-Qiang
    Tang, Kun
    Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams, 2008, 20 (02): : 349 - 352
  • [9] Electro-optic sampling of optical pulses and electron bunches for a compact THz-FEL source
    Wu, Bang
    Zhang, Zhe
    Cao, Lei
    Fu, Qiang
    Xiong, Yongqian
    INFRARED PHYSICS & TECHNOLOGY, 2018, 92 : 287 - 294
  • [10] Unveiling the Complex Shapes of Relativistic Electrons Bunches, Using Photonic Time-Stretch Electro-Optic Sampling
    Szwaj, Christophe
    Evain, Clement
    Le Parquier, Marc
    Bielawski, Serge
    Roussel, Eleonore
    Manceron, Laurent
    Brubach, Jean-Blaise
    Tordeux, Marie-Agnes
    Ricaud, Jean-Paul
    Cassinari, Lodovico
    Labat, Marie
    Couprie, Marie-Emmanuelle
    Roy, Pascale
    Borysenko, Andrii
    Hiller, Nicole
    Mueller, Anke-Susanne
    Steinmann, Johannes Leonard
    2016 IEEE PHOTONICS SOCIETY SUMMER TOPICAL MEETING SERIES (SUM), 2016, : 136 - 137