Micro-XANES by EPMA spectrometer

被引：7

作者：

Kawai, J ^{[1
]}

Hayashi, K

Takahashi, H

Kitajima, Y

机构：

[1] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan

[2] Jeol Ltd, Tokyo 1968558, Japan

[3] High Energy Eccelerator Res Org, Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷

关键词：

X-ray emission spectroscopy; electron probe X-ray microanalyzer; EPMA; radiative Auger effect; EXEFS;

D O I：

10.1107/S0909049598017270

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

XANES (X-ray absorption near edge structure) spectrum of an area of a few tens of square micrometers of MgO is measured with an EPMA (electron probe X-ray microanalyzer) using a novel method -- EXEFS (extended X-ray emission fine structure) method -- proposed by the present authors. The EXEFS method has the following six remarkable characteristics: (1) high energy resolution, (2) high spatial resolution, (3) short measuring time, (4) easy sample preparation, (5) convenient without using synchrotron radiation facilities, and (6) good at measuring soft X-ray absorption spectra.

引用

页码：356 / 358

页数：3

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