Micro-XANES by EPMA spectrometer

被引：7
|
作者：
Kawai, J [1 ]
Hayashi, K
Takahashi, H
Kitajima, Y
机构：
[1] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
[2] Jeol Ltd, Tokyo 1968558, Japan
[3] High Energy Eccelerator Res Org, Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan
来源：
JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷
关键词：
X-ray emission spectroscopy; electron probe X-ray microanalyzer; EPMA; radiative Auger effect; EXEFS;
D O I：
10.1107/S0909049598017270
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
XANES (X-ray absorption near edge structure) spectrum of an area of a few tens of square micrometers of MgO is measured with an EPMA (electron probe X-ray microanalyzer) using a novel method -- EXEFS (extended X-ray emission fine structure) method -- proposed by the present authors. The EXEFS method has the following six remarkable characteristics: (1) high energy resolution, (2) high spatial resolution, (3) short measuring time, (4) easy sample preparation, (5) convenient without using synchrotron radiation facilities, and (6) good at measuring soft X-ray absorption spectra.
引用
收藏
页码：356 / 358
页数：3
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