共 50 条
- [41] Metrology of laser-produced plasma light source for EUV lithography Metrology, Inspection, and Process Control for Microlithography XIX, Pts 1-3, 2005, 5752 : 1248 - 1256
- [44] Microbunch Instability Observations from a THz Detector at Diamond Light Source IX INTERNATIONAL SYMPOSIUM ON RADIATION FROM RELATIVISTIC ELECTRONS IN PERIODIC STRUCTURES (RREPS-2011), 2012, 357
- [45] At-wavelength Metrology of X-ray Optics at Diamond Light Source ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS V, 2014, 9206
- [46] UV and VUV Calibration Capabilities at the Metrology Light Source for Solar and Atmospheric Research RADIATION PROCESSES IN THE ATMOSPHERE AND OCEAN (IRS2012), 2013, 1531 : 879 - 882
- [47] Beamline for metrology of x-ray/EUV optics at the advanced light source GRAZING INCIDENCE AND MULTILAYER X-RAY OPTICAL SYSTEMS, 1997, 3113 : 214 - 221
- [48] OPTICAL QUANTUM GENERATOR A NEW SOURCE OF LIGHT ITS PROPERTIES AND APPLICATIONS IN METROLOGY MEASUREMENT TECHNIQUES-USSR, 1966, (02): : 147 - +
- [50] A strong-field THz light source based on coherent transition radiation FRONTIERS IN PHYSICS, 2023, 11