A High Sensitivity 3-D Measurement Method of Minute Specimen Based on Microscope and Laser Projection

被引:0
|
作者
Zhang, Xueli [1 ]
Lu, Cunwei [1 ]
机构
[1] Fukuoka Inst Technol, Higashi Ku, Fukuoka 8110295, Japan
关键词
Laser projection; 3-D Measurement; Microscope; Sensitivity Analysis; Image Processing; SHAPE;
D O I
10.4028/www.scientific.net/MSF.750.280
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The aim of our research is to realize a high-sensitivity three-dimensional (3-D) shape measurement of target with an optical microscope. On the conventional method - shape from focus, it's to regulate focal length of microscope to obtain 3-D shape information of the specimen. However, the method is used the vertical stratification method to obtain 3-D shape information of total surface of target, and the variable focal length of zoom lens is limited therefore the measurement accurate is confined on the vertical direction. In order to solve these problems, we propose a high-sensitivity 3-D shape measurement method based on microscope and laser projection. The method is based on the slit pattern projection technique and 3-D image processing technique. The proposal method can be used for medicine, pharmacy, life science, and Material science.
引用
收藏
页码:280 / 283
页数:4
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