Comparative Study of Pd/B4C X-ray Multilayer Mirrors Fabricated by Magnetron Sputtering with Kr and Ar Gas

被引:16
|
作者
Ni, Hangjian [1 ]
Huang, Qiushi [1 ]
Liu, Genchang [1 ]
Qi, Runze [1 ]
Zhang, Zhong [1 ]
Li, Xiuhong [2 ]
Li, Zhongliang [2 ]
Wang, Jie [2 ]
Wang, Zhanshan [1 ]
机构
[1] Tongji Univ, Sch Phys Sci & Engn, Inst Precis Opt Engn, Key Lab Adv Microstruct Mat MOE, Shanghai 200092, Peoples R China
[2] Chinese Acad Sci, Shanghai Adv Res Inst, Zhangheng Rd 239, Shanghai 201204, Peoples R China
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
Pd; B4C; multilayer; interface quality; heavy noble gas; hard X-ray; BLAZED GRATINGS; INTERFACE;
D O I
10.3390/ma13204504
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Ultrathin Pd/B4C multilayers are suitable X-ray mirrors working at the photon energy region of 7-20 keV. To further improve the layer structure, Pd/B4C multilayers with a d-spacing of 2.5 nm were fabricated by magnetron sputtering using the heavy noble gas Kr and compared with the conventional ones fabricated by Ar. Although the Kr-sputtering process can work at a lower pressure, the interface width-especially the interface roughness-is a little larger than that made by Ar. A stronger polycrystallization and a lower content of sputter gas atoms were found in the Kr-made sample, which can be explained by the joint effect from less recoiled particles and lower sputtering pressure. A good reflectance of 68% of the Kr made multilayer was measured at 10 keV, which is only slightly lower than that of the Ar made sample (71%).
引用
收藏
页码:1 / 10
页数:10
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