共 50 条
- [32] METHOD OF ISOLATING VOLTAGE CONTRAST IN SCANNING ELECTRON MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (08): : 610 - &
- [33] Contrast differences between scanning ion and scanning electron microscope images JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2004, 22 (01): : 49 - 52
- [34] CONTRAST OF SECONDARY-ELECTRON IMAGE OF SCANNING ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (01): : 95 - &
- [36] TEST OF A CHROMATICALLY CORRECTED OBJECTIVE LENS OF AN ELECTRON-MICROSCOPE OPTIK, 1978, 52 (01): : 1 - 18
- [37] THE MAGNETIC ELECTRON MICROSCOPE OBJECTIVE LENS OF LOWEST CHROMATIC ABERRATION PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (387): : 188 - 192
- [38] OBJECTIVE LENS OF ELECTRON-MICROSCOPE FOR OBSERVING FERROMAGNETIC MATERIALS JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 282 - 282
- [39] FORMATION OF RELIEF CONTRAST OF EXTENDED SURFACES IN ELECTRON EMISSION MICROSCOPE AND SCANNING MICROSCOPE OPTIK, 1968, 27 (07): : 438 - &