Study on damage effect and threshold of high energy 1.06μm-wavelength long-pulse laser to photo detector

被引：0
|
作者：
Tang, Lei [1 ,2 ]
Wang, Jianhua [2 ]
Li, Jun [1 ]
Hao, Qun [2 ]
机构：
[1] Beijing Inst Special Electromech Technol, Beijing 100012, Peoples R China
[2] Beijing Inst Technol, Beijing 100081, Peoples R China
来源：
2012 16TH INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC LAUNCH TECHNOLOGY (EML) | 2012年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, the damage mechanism of high energy laser to photoelectric detector is studied. With a long pulse laser at the wavelength of 1.06 mu m, energy saturation threshold measurement and damage test for CCD camera and four-quadrant detector are performed separately. The test results will play important roles not only in design and development of laser but also in evaluation of operational effectiveness.
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页数：5
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