Ferromagnetic and structural properties of Ge1-xMnxTe epitaxial layers

被引：0

作者：

Knoff, W. ^{[1
]}

Dziawa, P. ^{[1
]}

Osinniy, V. ^{[1
]}

Taliashvili, B. ^{[1
]}

Domukhovski, V. ^{[1
]}

Diduszko, R. ^{[1
]}

Domagala, J. ^{[1
]}

Lusakowska, E. ^{[1
]}

Jakiela, R. ^{[1
]}

Story, T. ^{[1
]}

机构：

[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

来源：

MATERIALS SCIENCE-POLAND | 2008年 / 26卷 / 04期

关键词：

semimagnetic layer; magnetic properties;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ferromagnetic and structural properties of semimagnetic (diluted magnetic) monocrystalline Ge1-xMnxTe layers (x = 0.04 and x = 0.19) grown by molecular beam epitaxy on BaF2(111) substrates were experimentally studied by the SQUID magnetometry and by high resolution X-ray diffraction analysis. Based on the temperature dependence of the lattice parameter, the structural phase transition from the rock salt to the rhombohedral crystal lattice was experimentally found at T = 675 K in Ge1-xMnxTe (x = 0.04) layer. The ferromagnetic Curie temperature T-c in Ge1-xMnxTe layers was determined based on the measurements of temperature and magnetic field dependence of magnetization. In Ge1-xMnxTe with the highest Mn content studied (x = 0.19) the mean-field like analysis of magnetic properties showed the Curie temperature T-c = 40 K.

引用

页码：959 / 963

页数：5

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