Acoustic resonator microwave spectroscopy of thin lanthanate plates and tungsten films

被引：0
|
作者：
Alekseev, SG
Kotelyanskii, IM
Mansfel'd, GD
机构：
来源：
JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS | 2001年 / 46卷 / 12期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An original method is proposed and developed for the acoustic resonator microwave spectroscopy of thin layers (films), based on measurements and processing of the spectrum of a combined acoustic microwave resonator containing a layer under study, The acoustic wave absorption factor of a combined resonator structure can be obtained from the measured passband of the combined resonator with the separation of a series of parallel resonances using a special processing of experimental frequency dependences of the electromagnetic scattering factor of the combined resonator. The method is applied to studying the absorption in monocrystal lanthanate layers and thin tungsten films.
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页码：1384 / 1391
页数：8
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