Characterization of Miniature Near Field Probes for IC's Radiation Measurements

被引：0

作者：

Avram, Cristian ^{[1
]}

Gavrila, Gheorghe ^{[1
]}

Tao, Junwu ^{[2
]}

机构：

[1] Mil Tech Acad, Bucharest, Romania

[2] Natl Polytech Inst, Toulouse, France

来源：

PROCEEDINGS OF THE 2010 8TH INTERNATIONAL CONFERENCE ON COMMUNICATIONS (COMM) | 2010年

关键词：

near field scan; IC emission measurement; probe calibration; electromagnetic radiation;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the near-field scan bench developed at Electronics Laboratory at ENSEEIHT is presented. A simple methodology for calibrating the miniature probes is described, which allows to determine the electromagnetic radiation levels from an IC without needing fastidious post-processing calculations. Then, the near-field emissions from a imager integrated circuit are measured and analyzed. Scan results give accurate information about current flows and voltage drops and parasite coupling inside the component.

引用

页码：275 / 278

页数：4

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