Fabrication of 4H-SiC floating junction Schottky barrier diodes (Super-SBDs) and their electrical properties

被引:14
|
作者
Ota, C.
Nishio, J.
Hatakeyama, T.
Shinohe, T.
Kojima, K.
Nishizawa, S.
Ohashi, H.
机构
[1] Toshiba Co Ltd, Corporate Res & Dev Ctr, Kawasaki, Kanagawa 2128582, Japan
[2] Natl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, Japan
关键词
SBD; Super-SBD; floating layer; FOM (Figure of Merit);
D O I
10.4028/www.scientific.net/MSF.527-529.1175
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
4H-SiC floating junction Schottky barrier diodes (Super-SBDs) were fabricated. It was found that their properties are closest to the theoretical limitation, defined by the relationship between specific on-state resistance and breakdown voltage of 4H SiC-unipolar devices. They have a p-type floating layer designed as line-and-spacing. The specific on-state resistances of Super-SBDs with a few micrometers of spacing width were found to be nearly equal to those of conventional SBDs without p-type floating layer. The breakdown voltages of Super-SBDs were higher than those of conventional SBDs. Accordingly the properties of Super-SBDs have improved the trade-off between specific on-state resistance and breakdown voltage, and the highest value to date for Baliga's Figure of Merit (BFOM) has been obtained.
引用
收藏
页码:1175 / 1178
页数:4
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