Attenuation measurement technique for printed circuit board traces in a production environment

被引：0

作者：

Schuster, Christian ^{[1
]}

Deutsch, Alina ^{[1
]}

Klink, Erich ^{[2
]}

Krabbenhoft, Roger ^{[3
]}

机构：

[1] IBM Corp, TJ Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA

[2] IBM Deutschland Entwicklung GmbH, D-71032 Boblingen, Germany

[3] IBM Syst & Tecnol Grp, Rochester, MN 55901 USA

来源：

10TH IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS, PROCEEDINGS | 2006年

关键词：

D O I：

10.1109/SPI.2006.289153

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we explore an attenuation measurement technique for PCB traces that is simple, robust, and quick enough to be a viable solution for a printed circuit board production environment. The technique is based on time domain reflectometry and transmission (TDR/T) measurements of two traces of different length. The result is the trace attenuation with respect to frequency. The technique combines well-known time and frequency domain algorithms. Comparison of experimental data to alternative time and frequency domain approaches verify the proposed technique up to 15 GHz. The importance of a low reflection signal launch design is discussed.

引用

页码：143 / +

页数：2

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