Attenuation measurement technique for printed circuit board traces in a production environment

被引:0
|
作者
Schuster, Christian [1 ]
Deutsch, Alina [1 ]
Klink, Erich [2 ]
Krabbenhoft, Roger [3 ]
机构
[1] IBM Corp, TJ Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA
[2] IBM Deutschland Entwicklung GmbH, D-71032 Boblingen, Germany
[3] IBM Syst & Tecnol Grp, Rochester, MN 55901 USA
关键词
D O I
10.1109/SPI.2006.289153
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we explore an attenuation measurement technique for PCB traces that is simple, robust, and quick enough to be a viable solution for a printed circuit board production environment. The technique is based on time domain reflectometry and transmission (TDR/T) measurements of two traces of different length. The result is the trace attenuation with respect to frequency. The technique combines well-known time and frequency domain algorithms. Comparison of experimental data to alternative time and frequency domain approaches verify the proposed technique up to 15 GHz. The importance of a low reflection signal launch design is discussed.
引用
收藏
页码:143 / +
页数:2
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