Structural and Dielectric Characterizations of Pb(Sc1/2Nb1/2)O3-PbTiO3 Superlattice Thin Films

被引：0
|
作者：
Asanuma, Shutaro [1 ]
Uesu, Yoshiaki [1 ]
Malibert, Charlotte [2 ]
Kiat, Jean Michel [2 ]
机构：
[1] Waseda Univ, Dept Phys, Shinjuku Ku, Tokyo 1698555, Japan
[2] Ecole Cent Paris, Lab Struct Proprietes & Modelisat Solides, F-92295 Chatenay Malabry, France
来源：
FERROELECTRICS | 2007年 / 347卷
关键词：
relaxor; Pb(Sc1/2Nb1/2)O-3; (PbSc1/2Nb1/2O3)(0.57)-(PbTiO3)(0.43); thin film; pulsed laser deposition; dielectric constant; superlattice;
D O I：
10.1080/00150190601187567
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Epitaxial Pb(Sc1/2Nb1/2)O-3 (PSN) and PbTiO3 (PT) superlattice thin films are processed on single-stepped SrTiO3 (001) substrates by the pulsed laser deposition (PLD) technique. SrRuO3 is deposited on the substrate as a bottom electrode layer for dielectric measurements. The orientation and structure of the films are determined by X-ray diffraction (XRD) method. Clear superlattice reflections are observed by XRD and the period of superlattice is calculated from difference of 2 theta of superlattice reflection. Real part of dielectric constant is about 350 at room temperature in the frequency range of 10(2)-10(5) Hz.
引用
收藏
页码：174 / 178
页数：5
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