Magnetoresistance Investigations in Exchange-Biased IrMn/NiFe Bilayers
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作者:
Fulara, Himanshu
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机构:
Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, IndiaIndian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India
Fulara, Himanshu
[1
]
Chaudhary, Sujeet
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机构:
Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, IndiaIndian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India
Chaudhary, Sujeet
[1
]
Kashyap, Subhash C.
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Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, IndiaIndian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India
Kashyap, Subhash C.
[1
]
机构:
[1] Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India
Magnetoresistance;
Ion-beam sputtering;
Training effect;
Reversal asymmetry;
D O I:
10.1063/1.4791469
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Magnetoresistance measurements have been employed to demonstrate the thermal evolution of exchange bias, reversal asymmetry and training effect in ion-beam sputtered IrMn/NiFe bilayers. Magnetoresistance investigations have shown a significant increase in exchange bias field and coercivity, pronounced reversal asymmetry and, most prominently, a strong training effect all occurring at low temperature (T < 50 K). These experimental results are attributed to the occurrence of temperature dependent crossover from uniaxial to biaxial anisotropy in the IrMn layer.
机构:
Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Mohammadi, Jamileh Beik
Jones, Joshua Michael
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Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Jones, Joshua Michael
Paul, Soumalya
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Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Paul, Soumalya
Khodadadi, Behrouz
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Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Khodadadi, Behrouz
Mewes, Claudia K. A.
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Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Mewes, Claudia K. A.
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机构:
Mewes, Tim
Kaiser, Christian
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机构:
Western Digital, Fremont, CA 94539 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA