Structural investigation of GaInP nanowires using X-ray diffraction

被引：15

作者：

Kriegner, D. ^{[1
]}

Persson, J. M. ^{[2
]}

Etzelstorfer, T. ^{[1
]}

Jacobsson, D. ^{[3
,4
]}

Wallentin, J. ^{[3
,4
]}

Wagner, J. B. ^{[2
]}

Deppert, K. ^{[3
,4
]}

Borgstrom, M. T. ^{[3
,4
]}

Stangl, J. ^{[1
]}

机构：

[1] Johannes Kepler Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria

[2] Tech Univ Denmark, Ctr Electron Nanoscopy, DK-2800 Lyngby, Denmark

[3] Lund Univ, SE-22100 Lund, Sweden

[4] Lund Univ, Nanometer Struct Consortium, SE-22100 Lund, Sweden

来源：

THIN SOLID FILMS | 2013年 / 543卷

基金：

奥地利科学基金会;

关键词：

Nanowires; X-ray diffraction; III-V semiconductors; SOLAR-CELLS; ABSORPTION; LIGHT; INAS;

D O I：

10.1016/j.tsf.2013.02.112

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this work the structure of ternary GaxIn1-xP nanowires is investigated with respect to the chemical composition and homogeneity. The nanowires were grown by metal-organic vapor-phase epitaxy. For the investigation of ensemble fluctuations on several lateral length scales, X-ray diffraction reciprocal space maps have been analyzed. The data reveal a complicated varying materials composition across the sample and in the nanowires on the order of 20%. The use of modern synchrotron sources, where beam-sizes in the order of several 10 mu m are available, enables us to investigate compositional gradients along the sample by recording diffraction patterns at different positions. In addition, compositional variations were found also within single nanowires in X-ray energy dispersive spectroscopy measurements. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：100 / 105

页数：6

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