Near-Field to Far-Field Transformation for Fast Linear Slide Measurements

被引：0

作者：

Rodriguez Varela, Fernando ^{[1
]}

Tena Sanchez, Ruben ^{[1
,2
]}

Lopez Morales, Manuel Jose ^{[3
]}

Sierra-Castaner, Manuel ^{[1
]}

机构：

[1] Univ Politecn Madrid, Radiat Grp, Madrid, Spain

[2] Microwave Vis Italy SLR, Rome, Italy

[3] Univ Carlos III, Madrid, Spain

来源：

2020 14TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION (EUCAP 2020) | 2020年

关键词：

antenna measurements; plane wave spectrum; fast testing; single cut;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an algorithm for the far-field transformation of fields measured over linear cuts (slides) in planar measurement scenarios. Instead of scanning the complete plane, only two perpendicular slide measurements are performed, which reduces drastically measurement times. From these two measurements, the radiation pattern in the main cuts can be obtained, and then, the full 3D pattern is derived. The algorithm is based on particularizing the planar near-field to far-field transformation theory to a one-dimensional space. The proposed technique is presented and tested using simulated and measured data, showing low transformation errors and promising capabilities for the fast testing of antennas.

引用

页数：5

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