Chemical Vapor Deposition-Derived Graphene with Electrical Performance of Exfoliated Graphene
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作者:
Petrone, Nicholas
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Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
Petrone, Nicholas
[1
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Dean, Cory R.
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Columbia Univ, Dept Mech Engn, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
Dean, Cory R.
[1
,2
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Meric, Inanc
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Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
Meric, Inanc
[2
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van der Zande, Arend M.
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Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
van der Zande, Arend M.
[1
]
Huang, Pinshane Y.
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Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
Huang, Pinshane Y.
[3
]
Wang, Lei
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Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
Wang, Lei
[1
]
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Muller, David
[3
,4
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Shepard, Kenneth L.
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机构:
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Mech Engn, New York, NY 10027 USA
Shepard, Kenneth L.
[2
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Hone, James
[1
]
机构:
[1] Columbia Univ, Dept Mech Engn, New York, NY 10027 USA
[2] Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
[3] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
[4] Cornell Univ, Kavli Inst, Ithaca, NY 14853 USA
While chemical vapor deposition (CVD) promises a scalable method to produce large-area graphene, CVD-grown graphene has heretofore exhibited inferior electronic properties in comparison with exfoliated samples. Here we test the electrical transport properties of CVD-grown graphene in which two important sources of disorder, namely grain boundaries and processing-induced contamination, are substantially reduced. We grow CVD graphene with grain sizes up to 250 mu m to abate grain boundaries, and we transfer graphene utilizing a novel, dry-transfer method to minimize chemical contamination. We fabricate devices on both silicon dioxide and hexagonal boron nitride (h-BN) dielectrics to probe the effects of substrate-induced disorder. On both substrate types, the large-grain CVD graphene samples are comparable in quality to the best reported exfoliated samples, as determined by low-temperature electrical transport and magnetotransport measurements. Small-grain samples exhibit much greater variation in quality and inferior performance by multiple measures, even in samples exhibiting high field-effect mobility. These results confirm the possibility of achieving high-performance graphene devices based on a scalable synthesis process.
机构:
Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Kim, Ki Woong
Song, Wooseok
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Song, Wooseok
Jung, Min Wook
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Jung, Min Wook
Kang, Min-A
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Kang, Min-A
Kwon, Soon Yeol
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Kwon, Soon Yeol
Myung, Sung
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Myung, Sung
Lim, Jongsun
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Lim, Jongsun
Lee, Sun Sook
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
Lee, Sun Sook
An, Ki-Seok
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Korea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South KoreaKorea Res Inst Chem Technol, Thin Film Mat Res Grp, Taejon 305600, South Korea
机构:
Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
Ren Wen-cai
Gao Li-bo
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Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
Gao Li-bo
Ma Lai-peng
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Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
Ma Lai-peng
Cheng Hui-ming
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机构:
Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China