Characterization of millimeter-wave antenna using photonic measurement techniques

被引：21

作者：

Togo, H ^{[1
]}

Sasaki, A ^{[1
]}

Hirata, A ^{[1
]}

Nagatsuma, T ^{[1
]}

机构：

[1] NTT Microsyst Integrat Labs, Kanagawa 2430198, Japan

来源：

INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING | 2004年 / 14卷 / 03期

关键词：

electro-optic sampling; millimeter wave; antenna; EO probe; time-domain measurement;

D O I：

10.1002/mmce.20012

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

This article describes an electric-field measurement system that is based on electro-optic sampling (EOS). This system is able to map near- and far-field patterns of millimeter waves radiated from antennas by scanning the electric-field sensor probe. With the bandwidth set to more than 150 GHz, it can detect an electric field of less than 1.0 V/m at 60 GHz. This electric field is about one-tenth the field limit detectable by conventional microwave EOS systems. A comparison of measured and calculated electric fields in both the frequency and time-domains demonstrates the accuracy and usefulness of the system. (C) 2004 Wiley Periodicals. Inc.

引用

页码：290 / 297

页数：8

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