Low Loss EELS Study of The Ultrathin SrTiO3 Film Grown on The Si Single Crystal

被引：0
|
作者：
Su, D. [1 ]
Couillard, M. [2 ]
Sawicki, M. [3 ]
Broadbridge, C. [3 ]
Zhu, Y. [1 ]
机构：
[1] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA
[2] Semicond Insights Inc, Kanata, ON K2K 2X2, Canada
[3] So Connecticut State Univ, Dept Phys, New Haven, CT 06515 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S143192760909566X
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1040 / 1041
页数：2
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