Phase-shifting projected fringe profilometry by binary-encoded projections

被引：0
|
作者：
Su, Wei -Hung [1 ]
Cheng, Nai-Jen [2 ]
机构：
[1] Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 804, Taiwan
[2] Natl Kaohsiung Univ Sci & Technol, Inst Photon & Commun, Kaohsiung 807, Taiwan
来源：
PHOTONIC FIBER AND CRYSTAL DEVICES: ADVANCES IN MATERIALS AND INNOVATIONS IN DEVICE APPLICATIONS XVI | 2022年 / 12229卷
关键词：
phase unwrapping; fringe analysis; fringe projection; phase-shifting; optical inspection; CODING METHOD; ALGORITHM; COLOR;
D O I：
10.1117/12.2632370
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A binary encoding algorithm is presented for phase-shifting projected fringe profilometry. It does not require additional projections to identify fringe orders. The pattern used for phase extraction can be used for phase unwrapping directly. Fringes can be discerned even though the surface color or reflectivity varies with positions.
引用
收藏
页数：7
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