Chirality Dependence of Exciton Energies in Double-Wall Carbon Nanotubes

被引：0

作者：

Tomio, Yuh ^{[1
]}

Suzuura, Hidekatsu ^{[1
]}

Uryu, Seiji ^{[2
]}

Ando, Tsuneya ^{[3
]}

机构：

[1] Hokkaido Univ, Grad Sch Engn, Div Appl Phys, Sapporo, Hokkaido 0608628, Japan

[2] Iwate Univ, Dept Mat Sci & Engn, Morioka, Iwate 0208551, Japan

[3] Tokyo Inst Technol, Dept Phys, Tokyo 1528551, Japan

来源：

PHYSICS OF SEMICONDUCTORS | 2013年 / 1566卷

关键词：

double-wall carbon nanotube; exciton; effective-mass theory; higher-order correction; family pattern;

D O I：

10.1063/1.4848321

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Exciton energies in double-wall carbon nanotubes are theoretically studied based on an effective-mass approximation. Effects of tube chirality responsible for family pattern of the exciton energies are included as higher-order corrections describing trigonal warping, curvature, and lattice distortion. The redshift of the exciton energy due to interwall screening exhibits a family pattern with small energy spread. The shift and its family spread of the inner tube are almost determined by the interwall distance and by whether the outer tube is semiconducting or metallic regardless of the detailed structure.

引用

页码：133 / +

页数：2

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