A low-cost BIST scheme for ADC testing

被引：0

作者：

Wang, YS ^{[1
]}

Wang, JX ^{[1
]}

Lai, FC ^{[1
]}

Ye, YZ ^{[1
]}

机构：

[1] Harbin Inst Technol, Ctr Microelect, Harbin 150001, Heilongjiang, Peoples R China

来源：

2005 6TH INTERNATIONAL CONFERENCE ON ASIC PROCEEDINGS, BOOKS 1 AND 2 | 2005年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A low-cost BIST scheme based on linear histogram for testing ADC is presented in this paper. A parallel time decomposition technique is presented to minimize not only hardware overhead but also testing time of the BIST scheme based on histogram. An area-efficient linear triangular waveform generator is discussed as test stimulus. The technique uses digital delta-sigma noise shaping to generate the on-chip precise analog stimulus and simplify the analog circuit of the generator at same time. A practical implementation is described and the performance is evaluated.

引用

页码：665 / 668

页数：4

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