A diagnosability metric for parametric path delay faults

被引：19
|
作者：
Sivaraman, M [1 ]
Strojwas, AJ [1 ]
机构：
[1] CARNEGIE MELLON UNIV,PITTSBURGH,PA 15213
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510874
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：316 / 322
页数：7
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