Design Automatic Fabric Defect Inspection System

被引:0
|
作者
Gao, Xiaoding [1 ]
Wang, Jiajia [1 ]
Nie, Zhaoming [1 ]
Li, Yuanchao [1 ]
机构
[1] Xian Polytech Univ, Mech & Elect Engn Coll, Xian 710048, Shaanxi, Peoples R China
关键词
Fabric defect; Automatic inspection; Processing digital image; DSP plus FPGA;
D O I
10.4028/www.scientific.net/AMR.490-495.1109
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The system with four pieces of DSP + FPGA and procesing the digital image information collected with the field reprogrammable array FPGA has been designed, it can realize the automatic detection for the fabric defect. The system make use of four pieces of TMS320C62x as the core to process the digital image information; The FPGA realizes the automatic detection system which controls the interconnect fabric defect. The program based on attributed relational histogram and support vector machin has been designed. The experiment show when the velocity of sample fabric is of 100m/s and 120m/s the rate of recognize nicely with which theautomatic fabric defect inspection system being provided can achieve 80% and 60%.
引用
收藏
页码:1109 / +
页数:2
相关论文
共 50 条
  • [41] Fabric defect inspection based on lattice segmentation and Gabor filtering
    Jia, Liang
    Chen, Chen
    Liang, Jiuzhen
    Hou, Zhenjie
    NEUROCOMPUTING, 2017, 238 : 84 - 102
  • [42] EDDs: A series of Efficient Defect Detectors for fabric quality inspection
    Zhou, Tong
    Zhang, Jiabin
    Su, Hu
    Zou, Wei
    Zhang, Bohao
    MEASUREMENT, 2021, 172
  • [43] Automatic defect severity scoring for 193 nm reticle defect inspection
    Karklin, L
    Altamirano, M
    Cai, L
    Phan, K
    Spence, C
    OPTICAL MICROLITHOGRAPHY XIV, PTS 1 AND 2, 2001, 4346 : 898 - 906
  • [44] Using Deep Learning ADC for Defect Classification for Automatic Defect Inspection
    Chi, Bryce
    Chen, Andy
    Chen, Jay
    Voots, Terry
    Wu, Maruko
    Kim, Cheolkyu
    Liu, Zhuan
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
  • [45] Classifier design of on-line surface defect inspection system for plates
    National Engineering Research Center of Advanced Rolling Technology, Univ. of Sci. and Technol. Beijing, Beijing 100083, China
    Kang T'ieh, 2006, 4 (47-50):
  • [46] The PCB Defect Inspection System Design Based on Lab Windows/CVI
    Wang Fen
    Li Xuemei
    Xu Gang
    2009 INTERNATIONAL CONFERENCE ON INDUSTRIAL MECHATRONICS AND AUTOMATION, 2009, : 485 - +
  • [47] Aperture design for a dark-field wafer defect inspection system
    Liu, Chao
    Xu, Shuang
    Liu, Yufei
    Xiao, Zainan
    APPLIED OPTICS, 2021, 60 (35) : 10830 - 10837
  • [48] Automatic Inspection of Woven Fabric Density of Solid Colour Fabric Density by the Hough Transform
    Pan, Ruru
    Gao, Weidong
    Liu, Jihong
    Wang, Hongbo
    FIBRES & TEXTILES IN EASTERN EUROPE, 2010, 18 (04) : 46 - 51
  • [49] Automatic inspection of woven fabric density of solid colour fabric density by the hough transform
    Pan, Ruru
    Gao, Weidong
    Liu, Jihong
    Wang, Hongbo
    Fibres and Textiles in Eastern Europe, 2010, 81 (04): : 46 - 51
  • [50] Automatic defect inspection system for steel products with exhaustive dynamic encoding algorithm for searches
    Yun, Jong Pil
    Lee, Sang Jun
    Koo, Gyogwon
    Shin, Crino
    Park, ChangHyun
    OPTICAL ENGINEERING, 2019, 58 (02)