Proton Accelerator's Direct Ionization Single Event Upset Test Procedure

被引：0
|
作者：
Akhmetov, A. O. [1 ,2 ]
Sorokoumov, G. S. [1 ,2 ]
Smolin, A. A. [1 ,2 ]
Bobrovsky, D. V. [1 ,2 ]
Boychenko, D. V. [1 ,2 ]
Nikiforov, A. Y. [1 ,2 ]
Shemyakov, A. E. [3 ]
机构：
[1] Specialized Elect Syst SPELS, Moscow, Russia
[2] Natl Res Nucl Univ NRNU MEPHI, Moscow, Russia
[3] Russian Acad Sci, PN Lebedev Phys Inst, Protvino, Russia
来源：
2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019) | 2019年
关键词：
D O I：
10.1109/miel.2019.8889634
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper presents single event upset (SEU) experimental results in Spartan-6 FPGA due to direct and indirect proton ionization. high energy proton beam and aluminum foils were used to decrease proton energy down to 1...20 MeV to observe proton direct ionization upsets.
引用
收藏
页码：107 / 110
页数：4
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