The effects of the Bragg curve on the nuclear track formation in CR-39 polycarbonate, with the atomic force microscopy approach

被引：0

作者：

Vazquez-Lopez, C. ^{[1
]}

Zendejas-Leal, B. E. ^{[1
]}

Fragoso, R. ^{[1
]}

Golzarri, J. I. ^{[2
]}

Espinosa, G. ^{[2
]}

机构：

[1] Inst Politecn Nacl, Ctr Invest & Estudios Avanzados, Dept Fis, Mexico City 07360, DF, Mexico

[2] Univ Nacl Autonoma Mexico, Inst Fis, Mexico City 04520, DF, Mexico

来源：

REVISTA MEXICANA DE FISICA | 2013年 / 59卷 / 02期

关键词：

Etched nuclear track profiles; CR-39; atomic force microscope (AFM); etched nuclear track simulation; etched nuclear track evolution;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The etching nuclear track parameters were analyzed, using atomic force microscopy (AFM), allowing the simulation of the nuclear track profiles evolution. For these experiments, CR-39 (Lantrack (TM)) was chosen, because the excellent energy response to alpha particles. Due to the AFM limitations, it was necessary to reduce the incident particle energy in order to reach the Bragg peak region in the AFM scanning process. The different profile shapes of the etched tracks were clearly observed in the evolution process.

引用

页码：165 / 169

页数：5

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