Formation of lanthanum beryllate real structure under different crystallization conditions

被引:7
|
作者
Tsvetkov, EG
Rylov, GM
Matrosov, VN
机构
[1] RAS, Div Inst Mineral & Petrog, SB, Novosibirsk 630058, Russia
[2] RAS, Inst Mineral & Petrog, SB, Novosibirsk, Russia
[3] State Polytech Acad Belarus, Minsk, BELARUS
关键词
optical materials; oxides; crystal growth; X-ray diffraction; defects;
D O I
10.1016/j.materresbull.2005.08.016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The aim of this paper is to characterize the major structural defects of lanthanum beryllate single crystals grown by the Czochralski method, including those doped with rare-earth elements, and to reveal their relationship to specific properties of the crystal structure of La2Be2O5 and with their crystallization conditions. As a basic method for research, we used transmission X-ray topography. It was established that the defect state of La2Be2O5 crystals prepared by this method can be caused by different types of dislocations and their ordered assemblies, solid-phase inclusions of crucible metal and eutectically co-crystallizing phases, as well as by face growth sectors with elevated content of dopant. We show a possibility for growing single crystals of doped lanthanum beryllate having a minimum quantity of structural defects that could be suitable for manufacture of high quality laser rods. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:307 / 318
页数:12
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