Reflection-time-of-flight spectrometer for two-electron (e,2e) coincidence spectroscopy on surfaces

被引：3
|
作者：
Kirschner, J. [1 ]
Kerherve, G. [1 ]
Winkler, C. [1 ]
机构：
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle, Saale, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 07期
关键词：
D O I：
10.1063/1.2949869
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In this article, a novel time-of-flight spectrometer for two-electron-emission (e,2e/gamma,2e) correlation spectroscopy from surfaces at low electron energies is presented. The spectrometer consists of electron optics that collect emitted electrons over a solid angle of approximately 1 sr and focus them onto a multichannel plate using a reflection technique. The flight time of an electron with kinetic energy of E(kin)similar or equal to 25 eV is around 100 ns. The corresponding time- and energy resolution are typically approximate to 1 ns and approximate to 0.65 eV, respectively. The first (e,2e) data obtained with the present setup from a LiF film are presented. (C) 2008 American Institute of Physics.
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页数：6
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