Research on micro displacement measurement technology based on chromatic confocal method

被引:3
|
作者
Qi Yuejing [1 ,2 ]
Lu Zengxiong [1 ,2 ]
Ma Jing [1 ,2 ,3 ]
Yang Guanghua [1 ,2 ]
Zhang Qingyang [1 ,2 ]
Li Bing [1 ,2 ]
Qi Wei [1 ,2 ]
Su Jiani [1 ,2 ]
机构
[1] Chinese Acad Sci, Acad Optoelect, Beijing 100094, Peoples R China
[2] Beijing Excimer Laser Technol & Engn Ctr, Beijing 100094, Peoples R China
[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
关键词
displacement measurement; chromatic confocal displacement sensor; hyperchromats; linearity;
D O I
10.1117/12.2505383
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Compared with other non-contact displacement sensors, the chromatic confocal sensor, which based on wavelength-displacement modulation technique, has no special requirements on the material and texture of the measured surface, and suitable for measuring the displacement of objects whose size range from micro to macro with high precision. In this paper, the chromatic confocal method is applied to measure the micro displacement. A hyperchromats with a measurement range of 1.27mm and linear regression coefficient R-2 of 0.996 has been designed by using ZEMAX optical design software. The experimental system of chromatic confocal displacement measurement is set up. Through two miniature fiber optic spectrometers, the large measurement range and high precision spectrum detection are realized. The system error is calibrated synthetically. The measurement range of 1.2mm and linear regression coefficient R(2 )of 0.997 is realized. The research results are of great significance for the development of micro-nanometer displacement measurement technology.
引用
收藏
页数:6
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