PHOTODETACHMENT OF H2- NEAR A SOFT REFLECTING SURFACE

被引：4

作者：

Haneef, Muhammad ^{[1
]}

Arif, Suneela ^{[1
]}

Akbar, Jehan ^{[1
]}

Zahir, Muhammad ^{[2
]}

Shah, Nasrullah ^{[3
]}

机构：

[1] Hazara Univ, Dept Phys, Lab Atom & Quantum Interference, Mansehra, Pakistan

[2] Univ Peshawar, Dept Stat, Peshawar, Pakistan

[3] Abdul Wali Khan Univ, Dept Chem, Mardan, Pakistan

来源：

JOURNAL OF THEORETICAL & COMPUTATIONAL CHEMISTRY | 2013年 / 12卷 / 03期

关键词：

Photodetachment; soft surface; imaging method; STATIC ELECTRIC-FIELD; MAGNETIC-FIELDS; CROSS-SECTION; NEAR-THRESHOLD; MOLECULAR ION; PARALLEL; INTERFACE;

D O I：

10.1142/S0219633613500107

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Photodetachment of H-2(-) near a soft reflecting surface is investigated by using theoretical imaging method. Analytical expressions are derived for detached electron flux and photo-detachment cross section. The surface strongly affects the results and induces oscillation in the detached electron spectra. The photodetachment cross section is double of the H- near a plane wall. For a very large distance between the surface and H-2(-) (R -> infinity) the cross section reduces to the cross section of two center system in free space.

引用

页数：10

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