Influence of flow ratio on mechanical and tribological properties of hydrogenated carbon nitride films prepared by DC-RF-PECVD

被引:13
|
作者
Hao, JY
Xu, T
Zhang, JY
Liu, WM [1 ]
机构
[1] Chinese Acad Sci, Lanzhou Inst Chem Phys, State Key Lab Solid Lubricat, Lanzhou 730000, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
关键词
D O I
10.1088/0022-3727/39/6/021
中图分类号
O59 [应用物理学];
学科分类号
摘要
Amorphous hydrogenated carbon nitride (a-CN:H) films were deposited onto silicon (n-100) substrates by dual direct current radio frequency plasma enhanced chemical vapour deposition with CH4 and N-2 as feedstock at different ratios. The composition and surface morphology of the films were characterized by means of x-ray photoelectron spectroscopy, Raman spectroscopy and atomic force microscopy; while the mechanical and tribological properties of the films were evaluated using nano-indentation and the UMT test system. It was found that the deposition rate of the films decreased significantly but the N/C ratio, the surface roughness and the WIG ratio of the films increased as the N-2/CH4 flow ratio increased. The nano-hardness and adhesion strength of the films to the silicon substrate sharply increased at first and then decreased with increasing N-2/CH4 flow ratio. Moreover, the wear resistance of the films varied with the N-2/CH4 flow ratio. The structure transformation from an sp(3)-like to sp(2)-like carbon-nitrogen network in the deposited films was also revealed.
引用
收藏
页码:1149 / 1155
页数:7
相关论文
共 50 条
  • [41] Barrier and mechanical properties of carbon steel coated with SiOx/SiOxCyHz, gradual films prepared by PECVD
    Rangel, Rita C. C.
    Cruz, Nilson C.
    Milella, Antonella
    Fracassi, Francesco
    Rangel, Elidiane C.
    SURFACE & COATINGS TECHNOLOGY, 2019, 378
  • [42] Influence of RF power on the electrical and mechanical properties of nano-structured carbon nitride thin films deposited by RF magnetron sputtering
    Banerjee, I.
    Kumari, Neelam
    Singh, Ashis K.
    Kumar, Mukesh
    Laha, Pinaki
    Panda, A. B.
    Pabi, S. K.
    Barhai, P. K.
    Mahapatra, S. K.
    THIN SOLID FILMS, 2010, 518 (24) : 7240 - 7244
  • [43] A correlation between the microstructure and optical properties of hydrogenated amorphous carbon films prepared by RF magnetron sputtering
    Clin, M
    Darand-Drouhin, O
    Zeinert, A
    Picot, JC
    DIAMOND AND RELATED MATERIALS, 1999, 8 (2-5) : 527 - 531
  • [44] Influence of the argon ratio on the structure and properties of thin films prepared using PECVD in TMSAc/Ar mixtures
    Kelarova, Stepanka
    Pribyl, Roman
    Homola, Vojtech
    Polcak, Josef
    Campbell, Anna Charvatova
    Havlicek, Marek
    Vrchovecka, Katerina
    Vaclavik, Richard
    Zabransky, Lukas
    Bursikova, Vilma
    VACUUM, 2023, 207
  • [45] Influence of annealing on microstructure and piezoresistive properties of boron-doped hydrogenated nanocrystalline silicon thin films prepared by PECVD
    Haibin Pan
    Jianning Ding
    Guanggui Cheng
    Journal of Materials Science: Materials in Electronics, 2015, 26 : 5353 - 5359
  • [47] Effect of nitrogen content on mechanical properties and tribological behaviors of hydrogenated amorphous carbon films prepared by ion beam assisted chemical vapor deposition
    Lin, JF
    Wan, ZC
    Wei, PJ
    Chu, HY
    Ai, CF
    THIN SOLID FILMS, 2004, 466 (1-2) : 137 - 150
  • [48] Structural, optical and mechanical properties of aluminium nitride films prepared by reactive DC magnetron sputtering
    Venkataraj, S
    Severin, D
    Drese, R
    Koerfer, F
    Wuttig, M
    THIN SOLID FILMS, 2006, 502 (1-2) : 235 - 239
  • [49] Effects of argon flow on structure, mechanical and tribological properties of amorphous carbon films
    Feng X.-G.
    Zhou H.
    Zhang Y.-S.
    Zheng Y.
    Zhang K.-F.
    Wang K.-L.
    Yang L.-M.-C.
    Zhang B.-R.
    Zhao Z.-Y.
    Zheng J.
    Liu X.-G.
    Zheng Y.-G.
    Surface Technology, 2021, 50 (10): : 263 - 269
  • [50] Influence of annealing on microstructure and piezoresistive properties of boron-doped hydrogenated nanocrystalline silicon thin films prepared by PECVD
    Pan, Haibin
    Ding, Jianning
    Cheng, Guanggui
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (07) : 5353 - 5359