Recoil Effects in Valence Band Photoemission of Organic Solids

被引:3
|
作者
Shang, Ming-Hui [1 ]
Fujikawa, Takashi [1 ]
Ueno, Nobuo [1 ]
机构
[1] Chiba Univ, Grad Sch Adv Integrat Sci, Inage Ku, Chiba 2638522, Japan
关键词
ENERGY PHOTOELECTRON-SPECTROSCOPY; RESOLUTION RESONANCE PHOTOEMISSION; CORRELATED ELECTRON-SYSTEMS; CROSS-SECTIONS; XPS SPECTRA; SURFACE; TEMPERATURE; PARAMETERS; HISTORY; STATES;
D O I
10.1021/ac4000865
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Recoil effects in valence band X-ray photoelectron spectroscopy (XPS) are studied for both abb-trifluorostyrene and styrene molecular crystal systems. The gradual changes of XPS spectra excited by several photon energies are theoretically investigated within the tight-binding approximation and harmonic approximation of lattice vibrations and have been explained in terms of not only atomic mass but also atomic orbital (AO) population. The recoil effect of valence band photoemission strongly depends on the population and partial photoionization cross section (PICS) of AOs as well as the masses of composite atoms. In abb-trifluorostyrene F 2p dominant bands show the recoil shift close to free F atom recoil shift, and C 2s dominant bands show that to free C atom recoil shift, whereas the mixed bands of C and F give rise to the peak asymmetries due to their different recoil shifts. For these systems, hydrogen contribution is negligibly small which is in contrast to our previous results for the crystals composed of small organic molecules. We also discuss some potential uses of the recoil shifts for these systems.
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页码:3739 / 3745
页数:7
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