Automated Specular Measurements of a Thin Film

被引：0
|
作者：
Briggs, Jenni L. [1 ]
机构：
[1] PIKE Technol, 6125 Cottonwood Dr, Madison, WI 53719 USA
来源：
SPECTROSCOPY | 2018年
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Using an automated sampling accessory the specular reflectivity of a thin film was characterized. Benefits of automation in terms of spectral optimization, time to complete the experiment, and reduction of spectral errors are discussed.
引用
收藏
页码：17 / 17
页数：1
相关论文
共 50 条
  • [11] Trypan-Assisted Automated Endothelial Cell Loss Measurements Compared With Specular Microscopy
    Bedard, Peter
    Justin, Jeff J.
    Hou, Joshua H.
    CORNEA, 2021, 40 (08) : 1031 - 1035
  • [12] ON THE USE OF SPECULAR NEUTRON REFLECTION IN THE STUDY OF ROUGHNESS AND INTERDIFFUSION IN THIN-FILM STRUCTURES
    PLESHANOV, NK
    PUSENKOV, VM
    SCHEBETOV, AF
    PESKOV, BG
    SHMELEV, GE
    SIBER, EV
    SOROKO, ZN
    PHYSICA B, 1994, 198 (1-3): : 27 - 32
  • [13] Comparison of Manual and Automated Grading Methods for Corneal Endothelial Cell Density Measurements by Specular Microscopy
    Modak, Cristina
    Huang, Jianyan
    Maram, Jyotsna
    Marion, Ken
    Obregon, Luisa
    Niemeyer, Moritz
    Sadda, Srinivas R.
    Chopra, Vikas
    Lee, Olivia L.
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2014, 55 (13)
  • [14] Comparison of manual & automated analysis methods for corneal endothelial cell density measurements by specular microscopy
    Huang, Jianyan
    Maram, Jyotsna
    Tepelus, Tudor C.
    Modak, Cristina
    Marion, Ken
    Sadda, SriniVas R.
    Chopra, Vikas
    Lee, Olivia L.
    JOURNAL OF OPTOMETRY, 2018, 11 (03) : 182 - 191
  • [15] Automated specular microscopy in slit lamp
    Caetano, CAC
    Ventura, L
    Sousa, SJF
    Isaac, F
    Lotufo, RD
    OPHTHALMIC TECHNOLOGIES X, 2000, 3908 : 236 - 242
  • [16] THIN FILM COMPONENTS IN RF POWER MEASUREMENTS
    LUSKOW, AA
    RADIO AND ELECTRONIC ENGINEER, 1966, 31 (05): : 265 - &
  • [17] Interlaboratory comparison of magnetic thin film measurements
    da Silva, FCS
    Wang, CM
    Pappas, DP
    JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 2003, 108 (02) : 125 - 134
  • [18] Measurements of thin-film elastic constants
    Hirao, Masahiko
    Ogi, Hirotsugu
    Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A, 2009, 75 (752): : 397 - 403
  • [19] MEASUREMENTS OF THE WEAR OF A THIN-FILM DISK
    PHIPPS, PBP
    IEEE TRANSACTIONS ON MAGNETICS, 1990, 26 (05) : 2496 - 2498
  • [20] PICKING A SPECTROPHOTOMETER FOR THIN-FILM MEASUREMENTS
    ARMITAGE, P
    PHOTONICS SPECTRA, 1986, 20 (04) : 63 - &
12345